FLM-UVPC Film Thickness Measurement Software

Diffuse Reflectance Measurement

This software calculates film thickness from the
peak positions of the interference pattern caused
by the film. Film thickness is calculated by the method
of least square using the wavelengths of the all peaks
and valleys within a specified wavelength range.
 

  • For UV-2450/2550/2600/2700/3600/SolidSpec

  • PC software
    (compatible OS: Windows XP/VISTA/7)

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